Electronic Design

Expanded DFT-Focused Test System Takes On More Applications

The V500 DFT-focused engineering test system includes new features and options for a wider range of applications. It includes optional support for delay (ac) scan to 30 MHz; I DDQ test methodologies; ...
EurekAlert!

An AI–DFT integrated framework accelerates materials discovery and design

Researchers from China University of Petroleum (East China), in collaboration with international partners, have reported a ...
Semiconductor Engineering

Power-Aware Test: Addressing Power Challenges In DFT And Test

Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...
Design-Reuse

A Unified DFT Verification Methodology

In today’s fast growing Systems-on-Chip (SoC), incomplete or ineffective DFT support due to poor specification or loose design practices can quickly become the critical path to making market windows ...
Mirage News

AI-DFT Framework Speeds Up Materials Discovery

Researchers from China University of Petroleum (East China), in collaboration with international partners, have reported a comprehensive review of ...
Electronic Design

DFT Strategies for SOC Designs

Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...